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used in the area of material
No test is provided for the blend radius at the apex of the notch
4 This Guide reviews conditions and limitations for specific water reuse applications
This procedure applies only to large scale bulk purifiers rated at greater than 50 liters-per-minute (LPM) flow rate
It defines the view of the equipment through the SECS communication link
HB00600 - SEMI HB6 - Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers by Using Optical Probes StdPbc-0817 used in the area ofThis Standard was technically approved by the HB LED Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 4, 2015. Available at www. semiviews. org and www. semi. org in March 2016; originally published June 2015. Crystalline sapphire wafers (CSW) are used as substrates for manufacturing compound semiconductor devices, in particular high brightness light emitting diodes (HB
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