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190–800 nm 80 Hz sampling
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BLC-20/30 UV Lamp
Spectral Reflectance Film Thickness Measurement System thin-film icm10-stat:nth-child(2) { border-right: noneSpectral Reflectance Technology Precision Film Thickness Measurement Non Contact Nanometer to Micrometer Analysis High precision film thickness measurement based on advanced spectral reflectance technology. Enables accurate, non contact measurement from 5 nm to 250 m across semiconductors, photovoltaics, optical coatings, and biomedical applications. Direct replacement for Filmetrics F20 systems. Request Application Study 0. 1 nm Repeatability 5 nm